@misc{indiciae3865c6740a68,
  title = {Within Visit Test-Retest Reliability of EEG Profiles in Children with Autism Spectrum Disorder and Typical Development},
  author = {Levin, A. R. and Naples, A. and Scheffler, A. W. and Webb, S. J. and Shic, F. and Sugar, C. A. and Murias, M. and Bernier, R. A. and Chawarska, K. and Dawson, G. and Faja, S. and Jeste, S. and Nelson, C. A. and McPartland, J. C. and Senturk, D. and Autism Biomarkers Consortium for Clinical Trials,},
  year = {2019},
  doi = {10.1101/834697},
  url = {https://www.biorxiv.org/content/10.1101/834697v1},
  note = {Source identifier: 10.1101/834697}
}