@misc{indiciae4e0e28d2c0fb,
  title = {Characterizing nanometric thin films with far-field light},
  author = {Klimovsky, H. and Shavit, O. and Julien, C. and Olevsko, I. and Hamode, M. and Abulafia, Y. and Suaudeau, H. and Armand, V. and Oheim, M. and Salomon, A.},
  year = {2022},
  doi = {10.1101/2022.08.15.503956},
  url = {https://www.biorxiv.org/content/10.1101/2022.08.15.503956v1},
  note = {Source identifier: 10.1101/2022.08.15.503956}
}