TY  - RPRT
TI  - Study of aging using circuit tests and parametric analysis
AU  - Konishi, T.
AU  - Yanai, S.
AU  - Endo, S.
PY  - 2022
DO  - 10.1101/2022.03.24.485723
UR  - https://www.biorxiv.org/content/10.1101/2022.03.24.485723v1
ID  - 10.1101/2022.03.24.485723
ER  -